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Eryan Kong, Dongcheng Liu et al., Anatomical and chemical characteristics associated with lodging resistance in wheat. The Crop Journal. 2013, 1: 43-49.

Eryan Kong, Dongcheng Liu, Xiaoli Guo, Wenlong Yang, Jiazhu Sun, Xin Li, Kehui Zhan, Dangqun Cui, Jinxing Lin, and Aimin Zhang. Anatomical and chemical characteristics associated with lodging resistance in wheat. The Crop Journal. 2013, 1: 43-49.

 

Abstract:Anatomical and chemical characteristics of stems affect lodging in wheat (Triticum aestivum L.) cultivars. Traits associated with lodging resistance, such as plant height, stem strength, culm wall thickness, pith diameter, and stem diameter, were extensively investigated in earlier studies. However, the solid stem trait was rarely considered. In this study, we measured a range of anatomical and chemical characteristics on solid and hollow stemmed wheat cultivars. Significant correlations were detected between resistance to lodging and several anatomical features, including width of mechanical tissue, weight of low internodes, and width of stem walls. Morphological features that gave the best indication of improved lodging resistance were increased stem width, width of mechanical tissue layer, and stem density. Multiple linear regression analysis showed that 99% of the variation in lodging resistance could be explained by the width of the mechanical tissue layer, suggesting that solid stemmed wheat has several anatomical features for increasing resistance to lodging. In addition, microsatellite markers GWM247 and GWM340 were linked to a single solid stem QTL on chromosome 3BL in a population derived from the cross Xinongshixin (solid stem)/Line 3159 (hollow stem). These markers should be valuable in breeding wheat for solid stem.

 

文章链接:http://www.sciencedirect.com/science/article/pii/S2214514113000135

 
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